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Proceedings Paper

Method for characterizing multilayer coatings on curved substrates
Author(s): George Gutman; Kevin Parker; James Scholhamer; James L. Wood
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Paper Details

Date Published: 1 January 1992
PDF: 6 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51216
Show Author Affiliations
George Gutman, Ovonic Synthetic Materials Co. (United States)
Kevin Parker, Ovonic Synthetic Materials Co. (United States)
James Scholhamer, Ovonic Synthetic Materials Co. (United States)
James L. Wood, Ovonic Synthetic Materials Co. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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