Share Email Print
cover

Proceedings Paper

Inspection of pesticide residues on food by surface-enhanced Raman spectroscopy
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Modern agriculture depends on pesticides to curb infestations, increase crop yield and to produce the quantity and quality of food demanded by today's society. However, potential pesticide residue contamination of food is of critical concern to the food industry and the regulators responsible for health and safety. For example, many pesticides kill insects by attacking the central nervous system, and the use of these pesticides above the EPA set tolerance levels (from 0.1 to 50 ppm) could pose a threat to humans, in particular infants. Unfortunately, rapid, chemical analysis of pesticide residues is unavailable, and only a very small fraction of foods are inspected. The greatest concern is food imported from nations that simply ignore US regulations. In an effort to address this need, we have been developing a simple device to collect residues from food surfaces, perform a rapid chemical separation, and detect and identify pesticides by surface-enhanced Raman spectroscopy (SERS). Capillaries are coated with a metal-doped sol-gel that both separates chemicals and generates SER spectra when irradiated. SERS of pesticides at ppm concentrations, and a preliminary product to aid inspectors is presented.

Paper Details

Date Published: 30 March 2004
PDF: 7 pages
Proc. SPIE 5271, Monitoring Food Safety, Agriculture, and Plant Health, (30 March 2004); doi: 10.1117/12.511941
Show Author Affiliations
Chetan Shende, Real-Time Analyzers, Inc. (United States)
Alan Gift, Real-Time Analyzers, Inc. (United States)
Frank Inscore, Real-Time Analyzers, Inc. (United States)
Paul Maksymiuk, Real-Time Analyzers, Inc. (United States)
Stuart Farquharson, Real-Time Analyzers, Inc. (United States)


Published in SPIE Proceedings Vol. 5271:
Monitoring Food Safety, Agriculture, and Plant Health
George E. Meyer; Yud-Ren Chen; Shu-I Tu; Bent S. Bennedsen; Andre G. Senecal, Editor(s)

© SPIE. Terms of Use
Back to Top