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Proceedings Paper

Subelectron readout noise focal plane arrays for space imaging
Author(s): Gene Atlas; Mark Wadsworth
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Paper Abstract

Readout noise levels of under 1 electron have long been a goal for the FPA community. In the quest to enhance the FPA sensitivity, various approaches have been attempted ranging from the exotic Photo-multiplier tubes, Image Intensifier tubes, Avalanche photo diodes, and now the on-chip avalanche charge amplification technologies from the CCD manufacturers. While these techniques reduce the readout noise, each offers a set of compromises that negatively affect the overall performance of the sensor in parameters such as power dissipation, dynamic range, uniformity or system complexity. In this work, we overview the benefits and tradeoffs of each approach, and introduce a new technique based on ImagerLabs’ exclusive HIT technology which promises sub-electron read noise and other benefits without the tradeoffs of the other noise reduction techniques.

Paper Details

Date Published: 12 January 2004
PDF: 7 pages
Proc. SPIE 5167, Focal Plane Arrays for Space Telescopes, (12 January 2004); doi: 10.1117/12.511907
Show Author Affiliations
Gene Atlas, ImagerLabs (United States)
Mark Wadsworth, Tangent Technologies (United States)

Published in SPIE Proceedings Vol. 5167:
Focal Plane Arrays for Space Telescopes
Thomas J. Grycewicz; Craig R. McCreight, Editor(s)

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