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Proceedings Paper

Raman studies as a tool for characterization of the strained hexagonal GaN/AlxGa1-xN superlattices
Author(s): V. Yu. Davydov; A. N. Smirnov; I. N. Goncharuk; R. N. Kyutt; M. P. Scheglov; M. V. Baidakova; W. V. Lundin; E. E. Zavarin; M. B. Smirnov; S. V. Karpov; H. Harima
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Paper Abstract

It is shown that such parameters of GaN/AlxGa1-xN superlattice as the period, build-in strain, composition of the alloy, and individual layer thicknesses can be extracted from the energy positions, intensities, and line shapes of various optical and acoustical modes detected in Raman scattering.

Paper Details

Date Published: 11 June 2003
PDF: 4 pages
Proc. SPIE 5023, 10th International Symposium on Nanostructures: Physics and Technology, (11 June 2003); doi: 10.1117/12.511838
Show Author Affiliations
V. Yu. Davydov, A.F. Ioffe Physico-Technical Institute (Russia)
A. N. Smirnov, A.F. Ioffe Physico-Technical Institute (Russia)
I. N. Goncharuk, A.F. Ioffe Physico-Technical Institute (Russia)
R. N. Kyutt, A.F. Ioffe Physico-Technical Institute (Russia)
M. P. Scheglov, A.F. Ioffe Physico-Technical Institute (Russia)
M. V. Baidakova, A.F. Ioffe Physico-Technical Institute (Russia)
W. V. Lundin, A.F. Ioffe Physico-Technical Institute (Russia)
E. E. Zavarin, A.F. Ioffe Physico-Technical Institute (Russia)
M. B. Smirnov, St. Petersburg State Univ. (Russia)
S. V. Karpov, St. Petersburg State Univ. (Russia)
H. Harima, Kyoto Institute of Technology (Japan)


Published in SPIE Proceedings Vol. 5023:
10th International Symposium on Nanostructures: Physics and Technology
Zhores I. Alferov; Leo Esaki, Editor(s)

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