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Proceedings Paper

Study of oxidization process in real time using speckle correlation
Author(s): Mikiya Muramatsu; G. H. Guedes; Kiyofumi Matsuda; Thomas H. Barnes
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Paper Abstract

Speckle correlation, in real time, is used to detect the growth of the oxfdation layer in copper at room temperature.

Paper Details

Date Published: 1 January 1991
PDF: 6 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51129
Show Author Affiliations
Mikiya Muramatsu, Univ. of Sao Paulo (Brazil)
G. H. Guedes, Univ. of Sao Paulo (Brazil)
Kiyofumi Matsuda, Mechanical Engineering Lab. (Australia)
Thomas H. Barnes, Mechanical Engineering Lab. (New Zealand)


Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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