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Proceedings Paper

Advances in polarization metrology
Author(s): Russell A. Chipman
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Paper Abstract

Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.

Paper Details

Date Published: 6 November 2003
PDF: 8 pages
Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); doi: 10.1117/12.511279
Show Author Affiliations
Russell A. Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 5174:
Novel Optical Systems Design and Optimization VI
Jose M. Sasian; R. John Koshel; Paul K. Manhart, Editor(s)

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