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Proceedings Paper

Automatic, high-resolution analysis of low-noise fringes
Author(s): Gordon D. Lassahn
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Paper Abstract

We outline a fringe analysis algorithm that is completely automatic and has been demonstrated to give individual pixel resolution with good accuracy for very general types of fringe patterns, but is slow and quite sensitive to noise in the raw fringe image.

Paper Details

Date Published: 1 January 1991
PDF: 6 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51119
Show Author Affiliations
Gordon D. Lassahn, EG&G Idaho, Inc. (United States)


Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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