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Proceedings Paper

Characterization of integrated Bragg gratings on silicon-on-insulator rib waveguides
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Paper Abstract

Waveguide based Bragg grating devices have the potential of integration with passive or active optical components. A narrow bandwidth Bragg reflection filter or Fabry-Perot resonant structures can be realised using the approach of periodic refractive index modulation in waveguide gratings to form reflective structures. Most authors have considered 1st order Bragg gratings with periods of the order of 228nm operating at 1550nm but at the expense of complexity and high cost of fabrication. This paper describes the design of Silicon-On-Insulator (SOI) rib waveguides operating in the single mode regime that exhibit low polarisation dependence. A rigorous leaky mode propagation method (LMP) has been used to investigate the influence of etch depth in 3rd order Bragg gratings on the reflectance and bandwidth in the waveguides.

Paper Details

Date Published: 8 December 2003
PDF: 11 pages
Proc. SPIE 5248, Semiconductor Optoelectronic Devices for Lightwave Communication, (8 December 2003); doi: 10.1117/12.511138
Show Author Affiliations
Seong Phun Chan, Univ. of Surrey (United Kingdom)
Vittorio M. N. Passaro, Politecnico di Bari (Italy)
Soon Thor Lim, Univ. of Surrey (United Kingdom)
Ceng E. Png, Univ. of Surrey (United Kingdom)
William Headley, Univ. of Surrey (United Kingdom)
Goran Masanovic, Univ. of Surrey (United Kingdom)
Graham T. Reed, Univ. of Surrey (United Kingdom)
Ragheid M. H. Atta, Univ. of Southampton (United Kingdom)
Graham Ensell, Univ. of Southampton (United Kingdom)
Alan G. R. Evans, Univ. of Southampton (United Kingdom)


Published in SPIE Proceedings Vol. 5248:
Semiconductor Optoelectronic Devices for Lightwave Communication
Joachim Piprek, Editor(s)

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