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Proceedings Paper

Noncontact technique for the measurement of linear displacement using chirped diffraction gratings
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Paper Abstract

A noncontact method of monitoring structural displacement is demonstrated. The technique uses a lightweight diffraction grating with a variable period that is attached to the structure of interest. The position of the grating is monitored optically and linear displacement information can be separated from the effects of simultaneous rotary displacement. The technique is demonstrated for both static and dynamic measurements.

Paper Details

Date Published: 1 January 1991
PDF: 11 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51110
Show Author Affiliations
William B. Spillman, Simmonds Precision (United States)
Peter L. Fuhr, Univ. of Vermont (United States)


Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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