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Proceedings Paper

Development of a pulse laser-operated Mueller matrix polarimeter and implementation in the visible spectrum
Author(s): Bruno B.B. Boulbry; Bernard Le Jeune; Jack Cariou; Jean Lotrian
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Paper Abstract

Polarimetry technique allows one to study the changes induced by a physical system in the polarisation of electromagnetic waves. As its optical response is greatly affected by the polarisation state and wavelength of the incident light, a class of powerful polarimeters has been developed to measure the polarimetric response of a sample over a wide spectral band. Such a device, therefore, allows one to greatly increase the number of data about the sample of concern. The polarimeter of that sort we developed and implemented is operating with a pulse source. Moreover, by running a novel and theoretical model to describe the compensated waveplates used we focused on the reduction of systematic errors. This model takes into consideration the elliptical birefringence of each rotating device. In doing so, the precision currently given for the Mueller matrix elements is drastically improved. Simulations enabled us, first, to determine the measurement error on each element of the Mueller matrix without a sample and, second, to adopt a method of calibration. Experimental results and corrections highlight the interest of taking elliptical birefringence and dichroism into account. This calibration procedure led us to develop a compensated-waveplate characterisation bench. Then, a statistical study allowed us to greatly reduce and quantify the residual errors inherent in a measurement.

Paper Details

Date Published: 12 December 2003
PDF: 12 pages
Proc. SPIE 5158, Polarization Science and Remote Sensing, (12 December 2003); doi: 10.1117/12.511085
Show Author Affiliations
Bruno B.B. Boulbry, Univ. de Bretagne Occidentale (France)
Bernard Le Jeune, Univ. de Bretagne Occidentale (France)
Jack Cariou, Univ. de Bretagne Occidentale (France)
Jean Lotrian, Univ. de Bretagne Occidentale (France)


Published in SPIE Proceedings Vol. 5158:
Polarization Science and Remote Sensing
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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