Proceedings Paper
Laser-based triangulation techniques in optical inspection of industrial structures| Format | Member Price | Non-Member Price |
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Paper Abstract
An optical triangulation technique using a solid state laser diode sourceand detector, providing sub-pixel resolution on a
CCD detector was developed and is discussed. A novel approach to the problem of non-linear accuracy is outlined.
Results of extensive research into improving the accuracy of the device with particular reference to configuration, optical
components, the laser source, linearity, resolution, calibration and interpolation are presented.
Paper Details
Date Published: 1 January 1991
PDF: 13 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51096
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
PDF: 13 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51096
Show Author Affiliations
N. E. Lindsey, City Univ. (United Kingdom)
Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)
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