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Proceedings Paper

Convergent beam neutron crystallography
Author(s): Walter M. Gibson; Arthur J. Schultz; James W. Richardson; John M. Carpenter; David F. R. Mildner; Heather H. Chen-Mayer; M. E. Miller; E. Maxey; Henry J. Prask; Thomas H. Gnaeupel-Herold; Russell Youngman
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Paper Abstract

Applications of neutron diffraction for small samples (<1mm3) or small fiducial areas are limited by the available neutron flux density. Recent demonstrations of convergent beam electron and x-ray diffraction and focusing of cold (λ>1 Å) neutrons suggest the possibility to use convergent beam neutron diffraction for small sample crystallography. We have carried out a systematic study of diffraction of both monoenergetic and broad bandwidth neutrons at the NIST Research Reactor and at the Intense Pulsed Neutron Source (IPNS) at Argonne National Laboratory. Combining convergent beams with time-of-flight Laue diffraction is particularly attractive for high efficiency small sample diffraction studies. We have studied single crystal and powder diffraction of neutrons with convergence angles as large as 15° and have observed diffracted peak intensity gains greater than 20. The convergent beam method (CBM) shows promise for crystallography on small samples of small to medium size molecules (potentially even for proteins), ultra-high pressure samples, and for mapping of strain and texture distributions in larger samples.

Paper Details

Date Published: 30 December 2003
PDF: 11 pages
Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); doi: 10.1117/12.510736
Show Author Affiliations
Walter M. Gibson, X-Ray Optical Systems, Inc. (United States)
Arthur J. Schultz, Argonne National Lab. (United States)
James W. Richardson, Argonne National Lab. (United States)
John M. Carpenter, Argonne National Lab. (United States)
David F. R. Mildner, National Institute of Standards and Technology (United States)
Heather H. Chen-Mayer, National Institute of Standards and Technology (United States)
M. E. Miller, Argonne National Lab. (United States)
E. Maxey, Argonne National Lab. (United States)
Henry J. Prask, National Institute of Standards and Technology (United States)
Thomas H. Gnaeupel-Herold, National Institute of Standards and Technology (United States)
Russell Youngman, X-Ray Optical Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 5199:
Penetrating Radiation Systems and Applications V
H. Bradford Barber; F. Patrick Doty; Hans Roehrig, Editor(s)

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