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Proceedings Paper

Monitoring the last two (AR) layers in narrow-bandpass filters
Author(s): Ronald R. Willey
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Paper Abstract

The final corrections which might be made in the last two antireflection (AR) layers in the deposition of narrow bandpass filter designs such as might be used for Dense Wavelength Division Multiplexing (DWDM) in the fiber optics communications field were discussed in a previous report. A broader range of techniques and simulations of those final layer adjustments are described here, how they can be done, and the benefits which might be obtained. A surprisingly simple new technique is given which should yield improved results.

Paper Details

Date Published: 25 February 2004
PDF: 6 pages
Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); doi: 10.1117/12.510715
Show Author Affiliations
Ronald R. Willey, Willey Optical, Consultants (United States)


Published in SPIE Proceedings Vol. 5250:
Advances in Optical Thin Films
Claude Amra; Norbert Kaiser; H. Angus Macleod, Editor(s)

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