Share Email Print
cover

Proceedings Paper

Optical aspheric surface profiler using phase shift interferometry
Author(s): Kenji Sasaki; Akira Ono
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The optical aspheric surface profiler was developed. In the profiler a phase shift interferometric technique is used to measure an optical wavefront precisely and modified to be applied for an aspheric wavefront measurement. The profiler makes it easier to measure aspherical surfaces than the profiler using an optical probe or a stylus. The intensity distributions of fringe patterns from a Twyman-Green interferometer are obtained by a linear image sensor while a phase shifter driven by a piezoelectric transducer (PZT) moves. The charge coupled device (CCD) linear image sensor, which has smaller pixels than an area image sensor, detects fine fringe patterns from aspherical surfaces. The fringe data are transmitted into a computer and calculated into the wavefront phase data. In order to analyze the phase data, a non-linear least squares phase fitting method is used to eliminate the effects of the setting error of a tested surface. The profile error from the designed surface, whose parameters are previously saved into the computer, is calculated. The measurement results for the aspherical mirrors were compared to another profiler using a stylus. Finally, the new approach to analyze the phase data is proposed to solve the problem for this profiler and simulated for some data.

Paper Details

Date Published: 1 January 1991
PDF: 10 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51062
Show Author Affiliations
Kenji Sasaki, Toshiba Corp. (United States)
Akira Ono, Toshiba Corp. (Japan)


Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

© SPIE. Terms of Use
Back to Top