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Proceedings Paper

Focal length measurement using diffraction at a grating
Author(s): Rajpal S. Sirohi; Harish Kumar; Narinder Kumar Jain
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Paper Abstract

Diffraction at a low frequency grating is used for the measurement of focal length of a positive lens.

Paper Details

Date Published: 1 January 1991
PDF: 6 pages
Proc. SPIE 1332, Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection, (1 January 1991); doi: 10.1117/12.51050
Show Author Affiliations
Rajpal S. Sirohi, Indian Institute of Technology/Madras (India)
Harish Kumar, Indian Institute of Technology (India)
Narinder Kumar Jain, Indian Institute of Technology (India)


Published in SPIE Proceedings Vol. 1332:
Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Chander Prakash Grover, Editor(s)

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