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Proceedings Paper

Optical image processing technology in recognizing specific trace
Author(s): Yunshan Wang; Shuchun Si; Jianqiang Xu; Canlin Zhou; Chengyong Gao
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Paper Abstract

The surface profile is presented various, that forming cause of the specific trace is different. The specific trace is distributed as two types, from its criterion. First, the criterion of the specific trace is large, surpass a millimeter, is called grand specific trace; Second, the criterion is small, more or less the same length micron, is called micron specific trace. Using projection, contracting beam micrography, two-dimensions adusting image mode exchange, low-pass filter off noise, wavelet, and intelligent mode phase reconstruction, the surface profile of recognizing specific trace is given exactly and rapidly, that is a new optical image processing technology in recognition and diagnosis. This paper introduces the speciality above the technology and gave typical examples.

Paper Details

Date Published: 29 April 2003
PDF: 5 pages
Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.510312
Show Author Affiliations
Yunshan Wang, Shandong Univ. (China)
Shuchun Si, Shandong Univ. (China)
Jianqiang Xu, Shandong Univ. (China)
Canlin Zhou, Shandong Univ. (China)
Chengyong Gao, Shandong Univ. (China)

Published in SPIE Proceedings Vol. 5058:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer, Editor(s)

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