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Proceedings Paper

Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching
Author(s): Gomez W Wright; Giuseppe S. Camarda; Edson Kakuno; Longxia Li; Fengying Lu; Chun Lee; Arnold Burger; Jack I. Trombka; D. Peter Siddons; Ralph B. James
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Paper Abstract

This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd0.9Zn0.1Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.

Paper Details

Date Published: 20 January 2004
PDF: 8 pages
Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.510180
Show Author Affiliations
Gomez W Wright, Brookhaven National Lab. (United States)
Giuseppe S. Camarda, Brookhaven National Lab. (United States)
Edson Kakuno, Brookhaven National Lab. (United States)
Longxia Li, Yinnel Tech, Inc. (United States)
Fengying Lu, Yinnel Tech, Inc. (United States)
Chun Lee, Yinnel Tech, Inc. (United States)
Arnold Burger, Fisk Univ. (United States)
Jack I. Trombka, NASA Goddard Space Flight Ctr. (United States)
D. Peter Siddons, Brookhaven National Lab. (United States)
Ralph B. James, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 5198:
Hard X-Ray and Gamma-Ray Detector Physics V
Larry A. Franks; Arnold Burger; Ralph B. James; Paul L. Hink, Editor(s)

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