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Proceedings Paper

Moire interferometry and carrier technique for interfacial fracture behavior analysis
Author(s): Jun Cheng; Ruhua Fang; Weimin Zheng
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Paper Abstract

In this paper, moire interferometry method is applied tostudy interfacial fracture behavior analysis of Porcelain-Fused-to-Metal restoration. The SIF with respect to the crack of four-point bending specimens are studied by moire interferometry. The Carrier technique is applied to get the phase and displacement of the interfacial crack. The SIF is attained by the method of this paper. The experimental result proves the moire interferometry method can be applied to the small specimen with the interfacial crack.

Paper Details

Date Published: 29 April 2003
PDF: 4 pages
Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.509833
Show Author Affiliations
Jun Cheng, Tongji Univ. (China)
Ruhua Fang, Tongji Univ. (China)
Tsinghua Univ. (China)
Weimin Zheng, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 5058:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer, Editor(s)

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