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Proceedings Paper

Combined shearography and speckle pattern photography for single-access multi-component surface strain measurement
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Paper Abstract

Full surface strain measurement requires the determination of two out-of-plane and four in-plane displacement gradient components of the surface strain tensor. Shearography is a full-field speckle interferometry technique with a sensitivity predominately to the out-of-plane displacenet gradient. Speckle pattern photography has the sensitivity to the in-plane displacement, and taking the derivative yields the in-plane dipslacment gradient. In this paper the two techniques are combined to yield a single-access multi-component surface strain measurement using shearography to measure the out-of-plane components and speckle pattern photography to measure the in-plane components. Results are presented of a multi-component surface strain measurement.

Paper Details

Date Published: 29 April 2003
PDF: 10 pages
Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.509780
Show Author Affiliations
Roger M. Groves, Cranfield Univ. (United Kingdom)
Shan Fu, Cranfield Univ. (United Kingdom)
Stephen W. James, Cranfield Univ. (United Kingdom)
Ralph P. Tatam, Cranfield Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 5058:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer, Editor(s)

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