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Proceedings Paper

Subpicosecond streak camera measurements at LLNL: from IR to x-rays
Author(s): Jaroslav Kuba; Ronnie Shepherd; Rex Booth; Richard E. Stewart; Edward Chin Wang Lee; Patrick Audebert; John K. Crane; Robert R. Cross; James Dunn; Paul T. Springer
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Paper Abstract

An ultra fast, sub-picosecond resolution streak camera has been recently developed at the LLNL. The camera is a versatile instrument with a wide operating wavelength range. The temporal resolution of up to 300 fs can be achieved, with routine operation at 500 fs. The streak camera has been operated in a wide wavelength range from IR to x-rays up to 2 keV. In this paper we briefly review the main design features that result in the unique properties of the streak camera and present its several scientific applications: (1) Streak camera characterization using a Michelson interferometer in visible range, (2) temporally resolved study of a transient x-ray laser at 14.7 nm, which enabled us to vary the x-ray laser pulse duration from ~2-6 ps by changing the pump laser parameters, and (3) an example of a time-resolved spectroscopy experiment with the streak camera.

Paper Details

Date Published: 28 January 2004
PDF: 10 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.509702
Show Author Affiliations
Jaroslav Kuba, Lawrence Livermore National Lab. (United States)
Ronnie Shepherd, Lawrence Livermore National Lab. (United States)
Rex Booth, Lawrence Livermore National Lab. (United States)
Richard E. Stewart, Lawrence Livermore National Lab. (United States)
Edward Chin Wang Lee, Lawrence Livermore National Lab. (United States)
Patrick Audebert, Lawrence Livermore National Lab. (United States)
John K. Crane, Lawrence Livermore National Lab. (United States)
Robert R. Cross, Lawrence Livermore National Lab. (United States)
James Dunn, Lawrence Livermore National Lab. (United States)
Paul T. Springer, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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