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Proceedings Paper

The development of hard x-ray optics at MSFC
Author(s): Brian D. Ramsey; Ron F. Elsner; Darell Engelhaupt; Mikhail V. Gubarev; Jeffery J. Kolodziejczak; Stephen L. O'Dell; Chet O. Speegle; Martin C. Weisskopf
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Paper Abstract

We have developed the electroformed-nickel replication process to enable us to fabricate light-weight, high-quality mirrors for the hard-x-ray region. Two projects currently utilizing this technology are the production of 240 mirror shells, of diameters ranging from 50 to 94 mm, for our HERO balloon payload, and 150- and 230-mm-diameter shells for a prototype Constellation-X hard-x-ray telescope module. The challenge for the former is to fabricate, mount, align and fly a large number of high-resolution mirrors within the constraints of a modest budget. For the latter, the challenge is to maintain high angular resolution despite weight-budget-driven mirror shell thicknesses (100 μm) which make the shells extremely sensitive to fabrication and handling stresses, and to ensure that the replication process does not degrade the ultra-smooth surface finish (~3Å) required for eventual multilayer coatings. We present a progress report on these two programs.

Paper Details

Date Published: 29 January 2004
PDF: 7 pages
Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.509619
Show Author Affiliations
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)
Ron F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Darell Engelhaupt, Univ. of Alabama in Huntsville (United States)
Mikhail V. Gubarev, Universities Space Research Association (United States)
Jeffery J. Kolodziejczak, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Chet O. Speegle, Raytheon Co. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 5168:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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