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Proceedings Paper

Latest measurement techniques at NPL for the characterization of infrared detectors and materials
Author(s): Evangelos Theocharous; Frank J. J. Clarke; Leon J. Rogers; Nigel P. Fox
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Paper Abstract

In its role as the national standards laboratory for the UK, the National Physical Laboratory (NPL) maintains, develops and disseminates, amongst others, the UK's detector spectral responsivity scale and material spectrometric scales (regular, hemispherical and angular reflectance and transmittance). In order to carry this work out detectors, materials, methods and facilities are continually under development at NPL. This paper will present the latest measurement techniques used at NPL that are applicable for the characterisation of infrared detectors and materials. NPL has extensive calibration capabilities, making use of grating and FT spectrometers and tuneable lasers, covering a wide spectral range, catering for single element, array, sub-pixel resolution and photon counting devices. As well spectral responsivity, detector spatial uniformity and linearity measurements are available. The UK spectrometric scales are maintained from 200 nm to 56 μm and include regular, hemispherical and angular reflectance and transmittance scales, and artefacts for the wavenumber and ordinate calibration of mid-infrared spectrometers.

Paper Details

Date Published: 8 December 2003
PDF: 12 pages
Proc. SPIE 5209, Materials for Infrared Detectors III, (8 December 2003); doi: 10.1117/12.509482
Show Author Affiliations
Evangelos Theocharous, National Physical Lab. (United Kingdom)
Frank J. J. Clarke, National Physical Lab. (United Kingdom)
Leon J. Rogers, National Physical Lab. (United Kingdom)
Nigel P. Fox, National Physical Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 5209:
Materials for Infrared Detectors III
Randolph E. Longshore; Sivalingam Sivananthan, Editor(s)

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