Share Email Print
cover

Proceedings Paper

On-machine measurement with LTP (long trace profiler)
Author(s): Sei Moriyasu; Peter Z. Takacs; Jun-ichi Kato; Weimin Lin; Yutaka Yamagata; Hitoshi Ohmori
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An on-machine measuring system based on the use of an LTP optical head was developed to accurately measure the slope error and profile error of long parts just after machining. Cylindrical surfaces can be measured completely by steering the beam up the sides of the cylinder with a rotatable mirror. To increase the reliability to measure the cylindrical surfaces, the optical system of the LTP head was improved. A personal computer collects all the data and controls the machine positioning and the beam steering mirror automatically.

Paper Details

Date Published: 22 December 2003
PDF: 8 pages
Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); doi: 10.1117/12.509457
Show Author Affiliations
Sei Moriyasu, RIKEN-The Institute of Physical and Chemical Research (Japan)
Peter Z. Takacs, Brookhaven National Lab. (United States)
Jun-ichi Kato, RIKEN-The Institute of Physical and Chemical Research (Japan)
Weimin Lin, RIKEN-The Institute of Physical and Chemical Research (Japan)
Yutaka Yamagata, RIKEN-The Institute of Physical and Chemical Research (Japan)
Hitoshi Ohmori, RIKEN-The Institute of Physical and Chemical Research (Japan)


Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top