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Proceedings Paper

Compact methods for measuring stress birefringence
Author(s): Nathan A. Hagen; Derek S. Sabatke; James F. Scholl; Peter A. Jansson; Weinong Wayne Chen; Eustace L. Dereniak; David T. Sass
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Paper Abstract

The recent development of channelled spectropolarimetry presents opportunities for spectropolarimetric measurements of dynamic phenomena in a very compact instrument. We present measurements of stress-induced birefringence in an ordinary plastic by both a reference rotating-compensator fixed-analyzer polarimeter and a channelled spectropolarimeter. The agreement between the two instruments shows the promise of the channelled technique and provides a proof-of-principle that the method can be used for a very simple conversion of imaging spectrometers into imaging spectropolarimeters.

Paper Details

Date Published: 12 December 2003
PDF: 9 pages
Proc. SPIE 5158, Polarization Science and Remote Sensing, (12 December 2003); doi: 10.1117/12.509424
Show Author Affiliations
Nathan A. Hagen, Optical Sciences Ctr./Univ. of Arizona (United States)
Derek S. Sabatke, Ball Aerospace and Technologies Corp. (United States)
James F. Scholl, Optical Sciences Ctr./Univ. of Arizona (United States)
Peter A. Jansson, Optical Sciences Ctr./Univ. of Arizona (United States)
Weinong Wayne Chen, Univ. of Arizona (United States)
Eustace L. Dereniak, Optical Sciences Ctr./Univ. of Arizona (United States)
David T. Sass, U.S. Army Tank-automotive and Armaments Command (United States)


Published in SPIE Proceedings Vol. 5158:
Polarization Science and Remote Sensing
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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