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Proceedings Paper

Three-dimensional profilometry using liquid crystal grating
Author(s): Hiroo Fujita; Ken Yamatan; Masayuki Yamamoto; Yukitoshi Otani; Akira Suguro; Shigeru Morokawa; Toru Yoshizawa
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Paper Abstract

This paper describes a device for 3D profile measurement systems, which are based on grating projection method using phase shifting technique for fringe analysis. As a key component of these systems, we propose to apply a liquid crystal (LC) grating instead of a conventional ruled grating, which has difficulty in speedy and accurate shifting of the projected pattern. This LC grating consists of 960 lines of stripe pattern on the substrate of 60×40 mm2 in size and has such features as 8 bits of gray levels in dynamic range in use of mono-chromatic applications. A sinusoidal pattern as well as a binary pattern in realized by combining pulse width modulation control and frame ratio control technqiue. In addition, the period of the pattern is arbitrarily controlled and shifting of the projected pattern is also electrically realized. We demonstrate a few examples measured by the system which uses this LC grating inside.

Paper Details

Date Published: 29 April 2003
PDF: 10 pages
Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.509410
Show Author Affiliations
Hiroo Fujita, Citizen Watch Corp. (Japan)
Ken Yamatan, Tokyo Univ. of Agriculture and Technology (Japan)
Masayuki Yamamoto, Tokyo Univ. of Agriculture and Technology (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Akira Suguro, Citizen Watch Corp. (Japan)
Shigeru Morokawa, Citizen Watch Corp. (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 5058:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
Gong Xin Shen; Soyoung S. Cha; Fu-Pen Chiang; Carolyn R. Mercer, Editor(s)

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