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Proceedings Paper

Simple and accurate technique to determine substrate indices by the multilayer Brewster angle measurement
Author(s): Feng Xiang; Gar Lam Yip
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Paper Details

Date Published: 1 December 1991
PDF: 7 pages
Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50897
Show Author Affiliations
Feng Xiang, McGill Univ. (Canada)
Gar Lam Yip, McGill Univ. (Canada)

Published in SPIE Proceedings Vol. 1583:
Integrated Optical Circuits

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