Share Email Print
cover

Proceedings Paper

Simple and accurate technique to determine substrate indices by the multilayer Brewster angle measurement
Author(s): Feng Xiang; Gar Lam Yip
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A reflected light by a substrate becomes zero when H-polarized light is incident at the Brewster angle. Stacking many identical substrates together forms a multi-layer structure. The valley of this reflected intensity pattern centered at the Brewster angle becomes narrower due to the overlapping of these similar reflections from many parallel interfaces of air and substrates. Thus, measuring the Brewster angle of this multi-layer structure leads to an accurate determination of the substrate index.

Paper Details

Date Published: 1 December 1991
PDF: 7 pages
Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50897
Show Author Affiliations
Feng Xiang, McGill Univ. (Canada)
Gar Lam Yip, McGill Univ. (Canada)


Published in SPIE Proceedings Vol. 1583:
Integrated Optical Circuits
Ka Kha Wong, Editor(s)

© SPIE. Terms of Use
Back to Top