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Proceedings Paper

X-pinch source size measurements
Author(s): Sergei A Pikuz; ByungMoo Song; Tatyana A Shelkovenko; Katherine M Chandler; Marc D. Mitchell; David A. Hammer
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Paper Abstract

The X pinch plasma emits subnanosecond bursts of x-rays in the 3 - 10 keV energy range from a very small source. As such, it has been used for high-resolution point-projection imaging of small, dense, rapidly changing plasmas, as well as submillimeter thick biological samples. The very small x-ray source size of the X pinch provides high spatial coherence of the x-rays, enabling the X pinch to be used for imaging low absorption, low contrast objects with excellent spatial resolution by incorporating wave-optics effects. The reverse procedure has been used to determine the X pinch x-ray source size: well-defined micro-fabricated slits were imaged by point-projection radiography, and the detailed patterns were compared with wave-optics calculations of the expected image patterns on film as a function of x-ray source size and energy band. In addition, an x-ray streak camera was used to study the X pinch source size as a function of time. Dynamic shadow images of a boron fiber with a tungsten core and glass fiber sheathed in plastic were compared with a time-integrated radiographic image. Source sizes as small as 1.2 μm (full width at half maximum, assuming a Gaussian spatial intensity profile for the source) have been inferred.

Paper Details

Date Published: 7 January 2004
PDF: 11 pages
Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.508752
Show Author Affiliations
Sergei A Pikuz, Cornell Univ. (United States)
P.N. Lebedev Physical Insitute (Russia)
ByungMoo Song, Cornell Univ. (United States)
Tatyana A Shelkovenko, Cornell Univ. (United States)
P.N. Lebedev Physical Institute (Russia)
Katherine M Chandler, Cornell Univ. (United States)
Marc D. Mitchell, Cornell Univ. (United States)
David A. Hammer, Cornell Univ. (United States)


Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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