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Proceedings Paper

Characterization of planar optical waveguides by K+ ion exchange in glass at 1.152 and 1.523 um
Author(s): Gar Lam Yip; Kiyoshi Kishioka; Feng Xiang; J. Y. Chen
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Paper Abstract

The WKB relation and mode indices measurement have been used to determine the important surface index change and effective depth of planar K+-ion exchanged waveguides in soda-lime glass at 1.152 and 1.523 mm for any given set of fabrication temperature and time, whereas the substrate index can be determined by a multi-layer Brewster angle measurement. The data obtained are important in the design and fabrication of K+-ion exchanged waveguides in single-mode fiber systems at 1.3 and 1.55 pm.

Paper Details

Date Published: 1 December 1991
PDF: 5 pages
Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50870
Show Author Affiliations
Gar Lam Yip, McGill Univ. (Canada)
Kiyoshi Kishioka, Osaka Electro-Communication Univ. (Japan)
Feng Xiang, McGill Univ. (Canada)
J. Y. Chen, McGill Univ. (Canada)


Published in SPIE Proceedings Vol. 1583:
Integrated Optical Circuits

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