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Proceedings Paper

Optical characterization in wide spectral range by a coherent spectrophotometer
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Paper Abstract

We report on the development and use of coherent spectrophotometers specialized for the unusual requirements of characterizing nonlinear optical materials and multilayer dielectric coatings used in laser systems. A large dynamic range is required to measure the linear properties of transmission, reflection and absorption and nonlinear properties of laser-induced damage threshold and nonlinear frequency conversion. Optical parametric oscillators generate coherent radiation that is widely tunable with instantaneous powers that can range from milliwatts to megawatts and are well matched to this application. As particular example a laser spectrophotometer based on optical parametric oscillators and a diode-pumped, Q-switched Nd:YAG laser and suitable for optical characterization in the spectral range 420-4500 nm is described. Measurements include reflectance and transmittance, absorption, scattering and laser-induced damage thresholds. Possibilities of a system based on a 130-fs Ti:sapphire laser and optical parametric generators are also discussed.

Paper Details

Date Published: 4 November 2003
PDF: 16 pages
Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (4 November 2003); doi: 10.1117/12.508642
Show Author Affiliations
Valdas Sirutkaitis, Vilnius Univ. (Lithuania)
Robert C. Eckardt, Cleveland Crystals, Inc. (United States)
Ona Balachninaite, Vilnius Univ. (Lithuania)
Rimantas Grigonis, Vilnius Univ. (Lithuania)
A. Melninkaitis, Vilnius Univ. (Lithuania)
T. Rakickas, Vilnius Univ. (Lithuania)


Published in SPIE Proceedings Vol. 5188:
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
Angela Duparre; Bhanwar Singh, Editor(s)

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