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Proceedings Paper

Modeling the effects of proton damage to CCDs on astrometric measurement precision
Author(s): Bryan N. Dorland
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Paper Abstract

High accuracy space astrometry missions such as the recently proposed AMEX will observe tens of millions of stars with mission measurement accuracies of less than 150 microarcseconds at mv = 9. In order to achieve this level of accuracy and coverage, focal planes containing tens of CCDs are necessary. These CCDs are exposed to damage from charged particles from Earth's radiation belts and solar wind. We have developed a computer simulation in order to estimate the effects of charged particle damage on the single measurement precision of an astrometric instrument in space. We describe the simulation in detail, and provide an example of its use in predicting the measurement performance of the AMEX instrument.

Paper Details

Date Published: 12 January 2004
PDF: 11 pages
Proc. SPIE 5167, Focal Plane Arrays for Space Telescopes, (12 January 2004); doi: 10.1117/12.508590
Show Author Affiliations
Bryan N. Dorland, U. S. Naval Observatory (United States)


Published in SPIE Proceedings Vol. 5167:
Focal Plane Arrays for Space Telescopes
Thomas J. Grycewicz; Craig R. McCreight, Editor(s)

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