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Proceedings Paper

Analysis and representation of BSDF and BRDF measurements
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Paper Abstract

BSDF and BRDF measurements of randomly rough surfaces are often limited to the plane of incidence. For a surface with no change in optical properties upon rotation in the plane of the sample, this is sufficient to completely represent the BRDF or BSDF of a material at a specific frequency. We apply a simple empirical model that accurately represents the full bi-directional dependence of the scatterance or reflectance based on this limited experimental data set. From these models the total integrated reflectance, total integrated scatterance, and emittance can be obtained. Example measurements of opaque painted flat surfaces, transparent samples, and fibers are presented.

Paper Details

Date Published: 14 November 2003
PDF: 10 pages
Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); doi: 10.1117/12.508560
Show Author Affiliations
Michael E. Thomas, Johns Hopkins Univ. (United States)
David W. Blodgett, Johns Hopkins Univ. (United States)
Daniel V. Hahn, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 5192:
Optical Diagnostic Methods for Inorganic Materials III
Leonard M. Hanssen, Editor(s)

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