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Proceedings Paper

Residual stress effects in ferrolectric thin films
Author(s): Nancy R. Sottos; Thomas Austin Berfield; Ryan Jason Ong; David A. Payne
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Date Published:
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Proc. SPIE 5053, Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics, ; doi: 10.1117/12.508250
Show Author Affiliations
Nancy R. Sottos, Univ. of Illinois, Urbana-Champaign (United States)
Thomas Austin Berfield, Univ. of Illinois, Urbana-Champaign (United States)
Ryan Jason Ong, Univ. of Illinois, Urbana-Champaign (United States)
David A. Payne, Univ. of Illinois, Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 5053:
Smart Structures and Materials 2003: Active Materials: Behavior and Mechanics
Dimitris C. Lagoudas, Editor(s)

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