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Proceedings Paper

New techniques for the measurement of x-ray beam or x-ray optics quality
Author(s): Philippe Zeitoun; Philippe Balcou; Samuel Bucourt; Djamel Benredjem; Franck Delmotte; Guillaume Dovillaire; Denis Douillet; James Dunn; G. Faivre; Marta Fajardo; Kenneth A. Goldberg; Mourad Idir; Sebastien Hubert; Jim Hunter; Sylvie Jacquemot; Sophie Kazamias; Sebastien le Pape; Xavier Levecq; Ciaran L. S. Lewis; Remy Marmoret; Pascal Mercere; A. S. Morlens; Patrick P. Naulleau; Christian Remond; Jorge J. Rocca; Stephane Sebban; Raymond F. Smith; Marie-Francoise Ravet; Philippe Troussel; Constance Valentin; Laurent Vanbostal
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Paper Abstract

Metrology of XUV beams and more specifically X-ray laser (XRL) beam is of crucial importance for development of applications. We have then developed several new optical systems enabling to measure the x-ray laser optical properties. By use of a Michelson interferometer working as a Fourier-Transform spectrometer, the line shapes of different x-ray lasers have been measured with an unprecedented accuracy (δλ/λ~10-6). Achievement of the first XUV wavefront sensor has enable to measure the beam quality of laser-pumped as well as discharge pumped x-ray lasers. Capillary discharge XRL has demonstrated a very good wavefront allowing to achieve intensity as high 3*1014 Wcm-2 by focusing with a f = 5 cm mirror. The measured sensor accuracy is as good as λ/120 at 13 nm. Commercial developments are under way.

Paper Details

Date Published: 19 December 2003
PDF: 11 pages
Proc. SPIE 5197, Soft X-Ray Lasers and Applications V, (19 December 2003); doi: 10.1117/12.508183
Show Author Affiliations
Philippe Zeitoun, Univ. Paris-Sud (France)
Philippe Balcou, ENSTA-Ecole Polytechnique (France)
Samuel Bucourt, Imagine Optic (France)
Djamel Benredjem, Univ. Paris-Sud (France)
Franck Delmotte, Univ. Paris-Sud (France)
Guillaume Dovillaire, Imagine Optic (France)
Denis Douillet, ENSTA-Ecole Polytechnique (France)
James Dunn, Lawrence Livermore National Lab. (United States)
G. Faivre, Univ. Paris-Sud (France)
Marta Fajardo, Univ. Paris-Sud (France)
Kenneth A. Goldberg, Lawrence Berkeley National Lab. (United States)
Mourad Idir, Univ. Paris-Sud (France)
Sebastien Hubert, ENSTA-Ecole Polytechnique (France)
Univ. Paris-Sud (France)
Jim Hunter, Lawrence Livermore National Lab. (United States)
Sylvie Jacquemot, Commissariat a l'Energie Atomique (France)
Sophie Kazamias, ENSTA-Ecole Polytechnique (France)
Sebastien le Pape, Univ. Paris-Sud (France)
Xavier Levecq, Imagine Optic (France)
Ciaran L. S. Lewis, Queen's Univ. of Belfast (United Kingdom)
Remy Marmoret, Commissariat a l'Energie Atomique (France)
Pascal Mercere, Univ. Paris-Sud (France)
A. S. Morlens, Univ. Paris-Sud (France)
Patrick P. Naulleau, Lawrence Berkeley National Lab. (United States)
Christian Remond, Commissariat a l'Energie Atomique (France)
Jorge J. Rocca, Colorado State Univ. (United States)
Stephane Sebban, ENSTA-Ecole Polytechnique (France)
Raymond F. Smith, Lawrence Livermore National Lab. (United States)
Marie-Francoise Ravet, Univ. Paris-Sud (France)
Philippe Troussel, Commissariat a l'Energie Atomique (France)
Constance Valentin, ENSTA-Ecole Polytechnique (France)
Laurent Vanbostal, Univ. Paris-Sud (France)


Published in SPIE Proceedings Vol. 5197:
Soft X-Ray Lasers and Applications V
Ernst E. Fill; Szymon Suckewer, Editor(s)

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