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Proceedings Paper

Application of morphological pseudoconvolutions to scanning-tunneling and atomic force microscopy
Author(s): Edward R. Dougherty; Andrew Weisman; Howard A. Mizes; R. J. Dwayne Miller
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Paper Abstract

A recently developed class of digital filters known as morphological pseudoconvolutions are applied to scanning tunneling microscopy (STM) images. These filters use morphological filtering to improve the characteristics of both moving mean and moving median filters. They filter equally in both the x and y directions, so as not to introduce artifacts, and they have an adjustable parameter that allows the user to restore the observed image completely as the parameter tends to infinity. Very few assumptions are made concerning image and noise content, only the shape of typical data being taken into account. These filters are shown to outperform, both visually and in the mean square error (MSE) sense, previously introduced Wiener filtering techniques. The filters are compared on typical STM type images, using both modeled and actual data. The technique is general, and has been shown to perform very well on all types of STM and Atomic Force Microscopy (AFM) images.

Paper Details

Date Published: 1 December 1991
PDF: 12 pages
Proc. SPIE 1567, Applications of Digital Image Processing XIV, (1 December 1991); doi: 10.1117/12.50807
Show Author Affiliations
Edward R. Dougherty, Rochester Institute of Technology (United States)
Andrew Weisman, Rochester Institute of Technology and Univ. of Rochester (United States)
Howard A. Mizes, Xerox/Webster Research Ctr. (United States)
R. J. Dwayne Miller, Univ. of Rochester (Canada)


Published in SPIE Proceedings Vol. 1567:
Applications of Digital Image Processing XIV
Andrew G. Tescher, Editor(s)

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