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Proceedings Paper

Multi-keV picosecond x-ray source development from ultra-intense kHz laser-cluster interaction
Author(s): Fabien Dorchies; Frederic Blasco; Christophe Bonte; Tony Caillaud; Jean-Claude Gauthier; Christian Stenz; Jorgen Stevefelt
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Paper Abstract

Multi-keV X-ray source from intense laser-cluster interaction was experimentally studied. A special effort was first made in order to characterize the cluster target. K-shell emission of Argon clusters (around 3 keV) was then studied when irradiated by kHz, 30 fs, 1017 W.cm-2 laser pulses. High-resolution spectra are presented, in this spectral range, as a function of laser duration and average cluster size. Signature of very highly charged ions (Ar16+) was observed with relatively low intensity laser pulses (few 1015 W.cm-2). This feature is not yet clearly understood nor reproduced by simulations. Optimal laser pulse duration was observed for X-ray production, depending on the cluster size. For the first time to our knowledge, the duration of K-shell X-ray bursts was measured with a home-made streak camera to be on the picosecond scale.

Paper Details

Date Published: 7 January 2004
PDF: 7 pages
Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507998
Show Author Affiliations
Fabien Dorchies, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserate a l'Energie Atomique (France)
Frederic Blasco, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)
Christophe Bonte, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)
Tony Caillaud, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)
Jean-Claude Gauthier, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)
Christian Stenz, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)
Jorgen Stevefelt, CNRS-CELIA/Univ. de Bordeaux I (France)
Commiserat a l'Energie Atomique (France)


Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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