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Proceedings Paper

Optical diffractometry with directionally variable incident light wave
Author(s): Marek Daszkiewicz
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Paper Abstract

Diffraction pattern representation of image (optical Fourier transform or Wiener spectrum) is very useful for computer image processing. An accurate analysis of spatial frequencies requires very well corrected lenses, and the diffraction pattern must by sampled by means of a moving detector or a stable multiple detector array strictly in the Fourier plane. The theoretical analysis of the diffraction pattern obtaining and sampling was provided. It was shown then the Fourier diffractometry with directionally changed incident light wave can be realized without above-mentioned limitations. In this method, a single stable detector is placed at the rear focus of a Fourier transform lens while the sampled diffraction pattern is moved over the Fourier plane. A suitable movement of the diffraction pattern can be obtained when the analyzed image is continuously illuminated with a parallel light beam whose inclination is changed with respect to the optical axis of the Fourier transform lens. This idea was applied for design a new generation of compact diffractometers with unsophisticated transforming lens.

Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1562, Devices for Optical Processing, (1 December 1991); doi: 10.1117/12.50796
Show Author Affiliations
Marek Daszkiewicz, Central Lab. of Optics (Poland)


Published in SPIE Proceedings Vol. 1562:
Devices for Optical Processing
Debra M. Gookin, Editor(s)

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