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Proceedings Paper

X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources
Author(s): Alla S. Shlyaptseva; Victor L. Kantsyrev; Nick D. Ouart; Dmitry A. Fedin; Safeia Hamasha; Stephanie B. Hansen
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Paper Abstract

The results of theoretical and experimental studies of anisotropic plasma sources are reported. They are based on x-ray line spectropolarimetry, a powerful new tool for investigating anisotropy of high-temperature plasmas. It is based on theoretical modeling of polarization-sensitive x-ray line spectra recorded simultaneously by two spectrometers with different sensitivities to polarization. The difference in these polarization-sensitive spectra is used to diagnose the parameters of anisotropic electron beams in plasmas. Theoretical predictions of polarization which cover a broad spectral range from K- to M-shell line radiation are presented. The results of Ti and Mo x-pinch polarization-sensitive experiments at UNR are overviewed. This diagnostic can be applied not only to x-pinches as demonstrated here but to laser-generated and other laboratory x-ray sources.

Paper Details

Date Published: 7 January 2004
PDF: 9 pages
Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507909
Show Author Affiliations
Alla S. Shlyaptseva, Univ. of Nevada/Reno (United States)
Victor L. Kantsyrev, Univ. of Nevada/Reno (United States)
Nick D. Ouart, Univ. of Nevada/Reno (United States)
Dmitry A. Fedin, Univ. of Nevada/Reno (United States)
Safeia Hamasha, Univ. of Nevada/Reno (United States)
Stephanie B. Hansen, Univ. of Nevada/Reno (United States)

Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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