Share Email Print
cover

Proceedings Paper

Analytical solution of excess fractions method in absolute distance interferometry
Author(s): Ilya P. Agurok
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A universal method for precision lenght measurements, called "excess fractions" was proposed at the end of the 18th century for the precise calibration of gauges. In this method, the interferometer compares an unknown gauge with the number of known wavelengths. The array of φi; which consists of the remainders of an integer number of wavelengths in the length of the gauges, was obtained and analyzed. For the measurement of gauge lengths that were small enough, the integer number of wavelengths can be found heuristically. With the development of lasers technique, the possibility of applying this idea to the measurement of large distances, such as the distance to the moon, appeared. With the imminent number of wavelengths in the distance, the heuistic solution is not possible. In this paper the solution based on Chinese Remainder Theorem is proposed. The Chinese Remainder Theorem is developed for use in the case, when wavelengths are not mutually prime numbers, and metrological aspects of this solution will be analyzed.

Paper Details

Date Published: 20 November 2003
PDF: 8 pages
Proc. SPIE 5190, Recent Developments in Traceable Dimensional Measurements II, (20 November 2003); doi: 10.1117/12.507797
Show Author Affiliations
Ilya P. Agurok, Physical Optics Corp. (United States)


Published in SPIE Proceedings Vol. 5190:
Recent Developments in Traceable Dimensional Measurements II
Jennifer E. Decker; Nicholas Brown, Editor(s)

© SPIE. Terms of Use
Back to Top