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Proceedings Paper

Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate
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Paper Abstract

A terahertz-scale two-dimensional photonic-crystal waveguide based on a silicon-on-insulator was fabricated, and the optical transmission spectrum was measured. Terahertz beam propagation characteristics were observed using a thermal imaging camera, with incident light in the 10.1-10.7μm range. The measured transmission spectrum was in very good agreement with a three-dimensional finite-difference time-domain calculation.

Paper Details

Date Published: 10 November 2003
PDF: 6 pages
Proc. SPIE 5181, Wave Optics and Photonic Devices for Optical Information Processing II, (10 November 2003); doi: 10.1117/12.507762
Show Author Affiliations
Chunchen Lin, Univ. of Delaware (United States)
Caihua Chen, Univ. of Delaware (United States)
Garrett J. Schneider, Univ. of Delaware (United States)
Peng Yao, Univ. of Delaware (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Ahmed Sharkawy, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)


Published in SPIE Proceedings Vol. 5181:
Wave Optics and Photonic Devices for Optical Information Processing II
Pierre Ambs; Fred R. Beyette, Editor(s)

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