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Proceedings Paper

Scattered data beam analyzer
Author(s): Javier Sanchez-Mondragon; Jesus Escobedo-Alatorre; Ramon Rodriguez-Vera; Roberto Rojas-Laguna; Romeo J. Selvas-Aguilar; Miguel Basurto-Pensado
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Paper Abstract

We provide an analysis of a data beam fitting method of N data points on a circular pupil that corresponds to its best rms fit that uses an orthogonal vectorial basis of the N data points. The solutions of many physical problems often result on finding specific solutions of basic functions Fnl(ρ,θ) with polar symmetries that also can be easily treated numerically. Unfortunately, in some other cases, the analytical solution loss its orthogonality by the experimental data discretization, therefore become inadequate for a best rms fit data. On the other hand, by introducing the Schmidt orthogonalization, we can get the best rms fit for the solution in the coefficients of the expansion and in Fnl(ρ,θ). In these cases, where the Fnl(ρ,θ) has a cumbersome convergence, we develop the rms fit based on Zernike like Polynomials and establish the proper transformation. We illustrate in more detail the method by developing a beam analyzer as an application.

Paper Details

Date Published: 10 November 2003
PDF: 6 pages
Proc. SPIE 5181, Wave Optics and Photonic Devices for Optical Information Processing II, (10 November 2003); doi: 10.1117/12.507399
Show Author Affiliations
Javier Sanchez-Mondragon, National Institute for Astrophysics, Optics, and Electronics (Mexico)
Jesus Escobedo-Alatorre, Autonomous State Univ. of Morelos (Mexico)
Ramon Rodriguez-Vera, Ctr. for Research in Optics (Mexico)
Roberto Rojas-Laguna, Autonomous Univ. of Guanajuato (Mexico)
Romeo J. Selvas-Aguilar, Ctr. for Research in Optics (Mexico)
Miguel Basurto-Pensado, Autonomous State Univ. of Morelos (Mexico)


Published in SPIE Proceedings Vol. 5181:
Wave Optics and Photonic Devices for Optical Information Processing II
Pierre Ambs; Fred R. Beyette, Editor(s)

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