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Proceedings Paper

Active detection of off-diagonal Mueller elements of rough targets
Author(s): Brian G. Hoover; David Charles Dayton; Jason E. Havey; John D. Gonglewski; Victor L. Gamiz; Laura J. Ulibarri
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Paper Abstract

Off-diagonal Mueller elements indicate polarization transformations as occur in polarizers and retarders. Target scattering may also generate off-diagonal elements, which then provide information unavailable from passive polarimetry or active depolarization measurements. The target and observation parameters required in active, monostatic systems for the detection of off-diagonal Mueller elements due to target scattering are investigated. The dependences of off-diagonal elements on incident angle, surface roughness, material composition, and target symmetry are investigated through analysis and measurements from two polarimeters. Multiple scattering and anisotropic roughness, which may result either from innate surface anisotropy or oblique incidence, are found to generate off-diagonal elements in the monostatic geometry. Results from a polarized microfacet scattering model corroborated with polarimeter data reveal a particular application of off-diagonal Mueller elements in the discrimination of dielectric from metal targets of similar roughness.

Paper Details

Date Published: 12 December 2003
PDF: 13 pages
Proc. SPIE 5158, Polarization Science and Remote Sensing, (12 December 2003); doi: 10.1117/12.507350
Show Author Affiliations
Brian G. Hoover, Applied Technology Associates (United States)
David Charles Dayton, Applied Technology Associates (United States)
Jason E. Havey, Applied Technology Associates (United States)
John D. Gonglewski, Air Force Research Lab. (United States)
Victor L. Gamiz, Air Force Research Lab. (United States)
Laura J. Ulibarri, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 5158:
Polarization Science and Remote Sensing
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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