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Proceedings Paper

Image formation with a scatter-probe near-field optical microscope
Author(s): Victor Ruiz-Cortes; Saul A. Zavala; Pedro Negrete-Regagnon; Eugenio R. Mendez; Hector M. Escamilla
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Paper Abstract

Using a scanning near-field optical microscope with a metallic probe tip, we investigate the formation of near-field optical images. The scatter-probe is used only for converting an evanescent field to a propagating field and the detection system is in the far-field. This situation models the usual experimental set up employed in scatter-probe near-field microscopy. We study a 2D model of the scattering of s-polarized light, in which the object is illuminated by total internal reflection. The calculations of the scattered intensity at constant height were based on an integral equation, method of moments approach.

Paper Details

Date Published: 16 October 2003
PDF: 6 pages
Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); doi: 10.1117/12.507329
Show Author Affiliations
Victor Ruiz-Cortes, Ctr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)
Saul A. Zavala, Ctr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)
Pedro Negrete-Regagnon, CCtr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)
Eugenio R. Mendez, Ctr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)
Hector M. Escamilla, Ctr. de Investigacion Cientifica y de Educacion Superior de Ensenada (Mexico)


Published in SPIE Proceedings Vol. 5189:
Surface Scattering and Diffraction III
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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