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Proceedings Paper

Physics-based polarimetric BRDF models
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Paper Abstract

Through the use of measurements and analysis we have devised a series of physics-based analytic models for the BRDF that describe the differential polarization of light scattered from a random rough surface. These models incorporate both intrinsic (refractive index) and extrinsic (statistical moments of the surface height variations) properties of the surface as well as wavelength dependence. Detailed surface statistics are acquired with a stylus scanner. Physical optics theory relates these statistics (and thus the complex coherence factor of the fields at the surface) to the far-field intensity of the scattered light. An outcome of these models is the ability to predict the spectrally varying differential polarization of emittance. Excellent agreement between measured and modeled BRDF’s is demonstrated.

Paper Details

Date Published: 14 November 2003
PDF: 12 pages
Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); doi: 10.1117/12.507317
Show Author Affiliations
Donald Dean Duncan, Johns Hopkins Univ. (United States)
Daniel V. Hahn, Johns Hopkins Univ. (United States)
Michael E. Thomas, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 5192:
Optical Diagnostic Methods for Inorganic Materials III
Leonard M. Hanssen, Editor(s)

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