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Proceedings Paper

Development of birefringence measurement with double rotating polarization components
Author(s): Norihiro Umeda; Satoshi Tanaka; Atsuo Takayanagi; Yukitoshi Otani; Hiroyuki Kohwa
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Paper Abstract

A novel birefringence measurement with double rotating polarization elements is proposed. This system includes rotating components of linear polarizer and quarter-wave plate with different rotating speeds. The birefringence is calculated by analyzing the Fourier components for rotation frequency in a detected signal. In this paper, the basic principle and experimental results of the birefringence measurement are described.

Paper Details

Date Published: 14 November 2003
PDF: 6 pages
Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); doi: 10.1117/12.507258
Show Author Affiliations
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Satoshi Tanaka, Tokyo Univ. of Agriculture and Technology (Japan)
Atsuo Takayanagi, Tokyo Univ. of Agriculture and Technology (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Hiroyuki Kohwa, UNIOPT Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 5192:
Optical Diagnostic Methods for Inorganic Materials III
Leonard M. Hanssen, Editor(s)

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