Share Email Print

Proceedings Paper

X-ray emission from laser-generated plasmas recorded by a transmission crystal spectrometer
Author(s): John F Seely; Rami Doron; Avi Bar-Shalom; Lawrence T Hudson; Christian Stoeckl
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A transmission crystal spectrometer was utilized to record the hard x-ray spectra from laser-produced plasmas in the 12 keV to 60 keV energy range and with a resolving power of E/ΔE≈100. This emission is of interest for the development of hard x-ray backlighters and hot electron diagnostics. Planar foils of U and Pb were irradiated at the OMEGA laser facility by 24 beams (12 on each side of the foil) with no beam smoothing. The spectra typically exhibited a few intense and relatively narrow features in the 12 keV to 22 keV energy range. Initial analysis suggested that these hard x-ray features are inner-shell transitions resulting from L-shell vacancies created by energetic electrons. The observed transition energies were slightly higher than the neutral-atom characteristic x-ray energies, and calculations suggested that the transitions are in the Ni-like or lower ionization stages.

Paper Details

Date Published: 7 January 2004
PDF: 8 pages
Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507170
Show Author Affiliations
John F Seely, Naval Research Lab. (United States)
Rami Doron, George Mason Univ. (United States)
Avi Bar-Shalom, ARTEP, Inc. (United States)
Lawrence T Hudson, National Institute of Standards and Technology (United States)
Christian Stoeckl, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 5196:
Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
George A. Kyrala; Jean-Claude J. Gauthier; Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

© SPIE. Terms of Use
Back to Top