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Proceedings Paper

Multispectral x-ray and gamma spectrometer
Author(s): Alfred Meidinger; Jennifer Sloane-Warren; Craig A. Kruschwitz; Paul O. Frederickson; Robert A. Hilko; Michael J. Berninger; Thomas W. Tunnell; Dan Keith Frayer; Donald V. Rosenberry
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Paper Abstract

It is well known that the attenuation length of radiation in any dense material increases with radiation energy. We propose a novel method of measuring x-ray and gamma spectra based on this principle. The multispectral x-ray and gamma spectrometer concept employs a scintillating material and optical camera system coupled via optical fibers. The optical fibers are placed sequentially at increasing depth with respect to the radiation path along the length of the scintillating material. Light generated by the interaction of radiation with the scintillating material is transported to the camera for recording and subsequent analysis. The proposed system will be used to determine the spectrum of incident radiation by deconvolving the radiation spectrum from the optical intensity (as a function of depth) of the recorded signals.

Paper Details

Date Published: 20 January 2004
PDF: 8 pages
Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.506831
Show Author Affiliations
Alfred Meidinger, Bechtel Nevada (United States)
Jennifer Sloane-Warren, Bechtel Nevada (United States)
Craig A. Kruschwitz, Bechtel Nevada (United States)
Paul O. Frederickson, Bechtel Nevada (United States)
Robert A. Hilko, Bechtel Nevada (United States)
Michael J. Berninger, Bechtel Nevada (United States)
Thomas W. Tunnell, Bechtel Nevada (United States)
Dan Keith Frayer, Bechtel Nevada (United States)
Donald V. Rosenberry, Bechtel Nevada (United States)

Published in SPIE Proceedings Vol. 5198:
Hard X-Ray and Gamma-Ray Detector Physics V
Larry A. Franks; Arnold Burger; Ralph B. James; Paul L. Hink, Editor(s)

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