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Proceedings Paper

Detecting low-contrast moving point targets
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Paper Abstract

The Tanner Research Wave Process is a moving point target detection algorithm that uses the spatio-temporal correlation of points from a target trajectory to build a large aggregate response, thereby increasing the probability of detection for dim and low-contrast point targets moving amidst dense background and noise. The Wave Process is naturally represented as a 2-D array of linear passive analog components, with each node directly stimulated by its focal plane detector. The Wave Process can be implemented in compact, low-power hardware: analog VLSI for near-focal-plane integration, and dedicated digital for near-term applications, both with a fine-grain parallel architecture that can accommodate fast-frame-rate sensors. The Wave Process generates a real-time Region of Interest to window focal planes, reducing the data rate and sensor processing throughput requirements, thereby also reducing the overall sensor processor power, weight, and size requirements.

Paper Details

Date Published: 5 January 2004
PDF: 10 pages
Proc. SPIE 5204, Signal and Data Processing of Small Targets 2003, (5 January 2004); doi: 10.1117/12.506423
Show Author Affiliations
Thomas J. Bartolac, Tanner Research, Inc. (United States)
Paul L. McCarley, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 5204:
Signal and Data Processing of Small Targets 2003
Oliver E. Drummond, Editor(s)

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