Share Email Print
cover

Proceedings Paper

Traceable radius of curvature measurements on a micro-interferometer
Author(s): Devendra Karodkar; Neil Gardner; Brent C. Bergner; Angela Davies
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Radius of curvature is a critical parameter to measure in the manufacturing of micro-refractive elements. It defines the power of the surface and provides important information about the stability and uniformity of the manufacturing process. The radius of curvature of an optical surface can be measured using an interferometer and radius slide where the distance is measured as the surface is moved between the confocal and cat’s eye positions. However, the radius of curvature for micro-refractive elements can be on the order of a few hundred microns and the uncertainty in the measurement due to stage error motions can become a significant portion of the tolerance. Typically the radius slide is calibrated using an artifact, but the radius of the artifact must be traceable to the base unit of length and the calibration is subject to misalignment errors. Alternatively, the stage error motions can be measured with standard machine tool metrology techniques and used to correct the errors in the radius of curvature measurement. This paper details the implementation of a directly traceable radius of curvature measurement on a micro-interferometer, including alignment procedures, measurement of stage error motions, displacement gauge calibration, and data analysis strategies.

Paper Details

Date Published: 22 December 2003
PDF: 13 pages
Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); doi: 10.1117/12.506416
Show Author Affiliations
Devendra Karodkar, Univ. of North Carolina/Charlotte (United States)
Neil Gardner, Univ. of North Carolina/Charlotte (United States)
Brent C. Bergner, Univ. of North Carolina/Charlotte (United States)
Angela Davies, Univ. of North Carolina/Charlotte (United States)


Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top