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Proceedings Paper

Precise free spectral range measurement of telecom etalons
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Paper Abstract

DWDM (dense wavelength division multiplexing) telecommunication applications depend on precise and dependable tuning and spacing of multiple optical frequencies, a task usually performed by etalons. The manufacture and quality assurance of these etalons requires an accurate, stable and deterministic measurement system. At VLOC, a JDSU swept-wavelength laser calibrated with an acetylene absorption cell was merely the starting point. By massive computerized data collection, curve-fitting, unique algorithms, and statistical methods, all performed within a custom LabView program, we were able to bootstrap the information from this system and achieve FSR measurement accuracy and stability far in excess of typical methods. In this paper we present the logical development of the technique, statistical modeling, and typical results. To date the system has been used for solid and air-gap etalons, both coated and uncoated, from 16 to 400 GHz FSR.

Paper Details

Date Published: 22 December 2003
PDF: 9 pages
Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); doi: 10.1117/12.506392
Show Author Affiliations
Ray Williamson, Ray Williamson Consulting (United States)
Chuck Terpstra, Independent (United States)

Published in SPIE Proceedings Vol. 5180:
Optical Manufacturing and Testing V
H. Philip Stahl, Editor(s)

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