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Proceedings Paper

X-ray optics for 50-100 keV undulator radiation using crystals and refractive lenses
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Paper Abstract

Compound refractive lenses (CRLs) are effective for collimating or focusing high-energy x-ray beams (50 - 100 keV) and can be used in conjunction with crystal optics in a variety of configurations, as demonstrated at the 1-ID undulator beamline of the Advanced Photon Source. As a primary example, this article describes the quadrupling of the output flux when a collimating CRL, composed of cylindrical holes in aluminum, is inserted in between two successive monochromators -- a modest energy resolution premonochromator followed by a high-resolution monochromator. The premonochromator is a cryogenically cooled, divergence-preserving, bent double-Laue Si(111) crystal device delivering an energy width ΔE/E ~10-3, sufficient for most experiments. The high-resolution monochromator is a four-reflection, flat Si(111) crystal system resembling two channel-cuts in a dispersive arrangement, reducing the bandwidth to ΔE/E < 10-4, as required for some applications. Tests with 67 keV and 81 keV photon energies show that the high-resolution monochromator, having a narrow angular acceptance of a few μrad, exhibits, a four-fold throughput enhancement due to the insertion of a CRL which reduces the premonochromatized beam's vertical divergence from 29 μrad to a few μrad. The ability to focus high-energy x-rays with CRLs having long focal lengths (tens of meters) is also shown by creating a line focus of 70 - 90 μm beam height in the beamline end-station with both the modest-energy-resolution and high-energy- resolution monochromatic x-rays.

Paper Details

Date Published: 23 December 2003
PDF: 13 pages
Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); doi: 10.1117/12.506374
Show Author Affiliations
Sarvjit D. Shastri, Argonne National Lab. (United States)
A. Mashayekhi, Argonne National Lab. (United States)
Jay Theodore Cremer, Adelphi Technology, Inc. (United States)
Melvin A. Piestrup, Adelphi Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 5195:
Crystals, Multilayers, and Other Synchrotron Optics
Tetsuya Ishikawa; Albert T. Macrander; James L. Wood, Editor(s)

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